WRTLT 2008 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Committees -- Additional Information

Scope

The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing. WRTLT'08, the ninth workshop, will be held in conjunction with the 17th Asian Test Symposium (ATS'08) in Sapporo, Japan. Areas of interest include but are not limited to:

(1) High level testing -- RTL/Behavior level testing, High level approaches for testing, RTL ATPG, RTL DFT, RTL BIST, Synthesis for testability, Relationship between RTL and gate level testing, Functional fault modeling, High level test bench generation

(2) SoC testing -- Test scheduling, Core testing, Interconnect testing, NoC testing

(3) Reliable SoC -- System level reliability, Self repair, Fault tolerant SoC

(4) Micro processor testing

(5) Design Verification

(6) Gate level test related issues -- Low power testing, Test compression, ATPG, DFT, BIST

This year we will set up the theme of "Power/Thermal-Aware Testing", which we believe needs to be discussed not only at gate level but also from high level in this workshop. Paper submissions related to this theme are especially welcomed. Panel discussion and a special session on this theme are being planned.

We hope and expect this workshop provides an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.

Submissions

top

Authors are invited to submit paper proposals for presentation at the workshop. The proposal may be an extended summary (1,000 words) or a full paper and should include: title, full name and affiliation of all authors, 50 words abstract, keywords and the name of contact author. All submissions should be sent to the following address as Postscript or PDF attachment.

wrtlt08submission@ip.elec.mie-u.ac.jp

The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript in time for inclusion in the digests and will present the paper at the Workshop.

Key Dates

top

Submission deadline: July 25, 2008
Notification of acceptance: September 11, 2008

Committees

top

General Chair
Tomoo Inoue, Hiroshima City University

General Vice-Chair
Toshinori Hosokawa, Nihon University

Program Chair
Tsuyoshi Shinogi, Mie University

Finance Chair
Satoshi Ohtake, NAIST

Publicity Chair
Xiaoqing Wen, Kyushu Institute of Technology

Publication Chair
Tomokazu Yoneda, NAIST

Registration Chair
Hiroyuki Yotsuyanagi, Tokushima University

Local Arrangement Chair
Hiroshi Yokoyama, Akita University

Audio Visual Chair
Masayuki Arai, Tokyo Metropolitan University

Secretary
Hideyuki Ichihara, Hiroshima City University

Ex Officio
Hideo Fujiwara , NAIST

Program Committee

Takashi Aikyo, Japan
JiNian Bian, China
Krishnendu Chakrabarty, USA
Tsin-Yuan Chang, Taiwan
Satoshi Fukumoto, Japan
Masaki Hashizume, Japan
Kazumi Hatayama, Japan
Terumine Hayashi, Japan
Yu Hu, China
Michiko Inoue, Japan
Hideo Ito, Japan
Kazuhiko Iwasaki, Japan
Seiji Kajihara, Japan
Erik Larsson, Sweden
Hua-Wei Li, China
Xiao-Wei Li, China
Zainalabedin Navabi, USA
Chia Yee Ooi, Malaysia
Alex Orailoglu, USA
Ilia Polian, Germany
Jaan Raik, Estonia
Kewal K. Saluja, USA
Hideo Tamamoto, Japan
Dong Xiang, China
ZhiQiang You, China
Danella Zhao, USA

Steering Committee

Chair: Xiaowei Li, China
Vice-Chair: Tomoo Inoue, Japan
Members:
  Hideo Fujiwara, Japan
  Terumine Hayashi, Japan
  Kazuhiko Iwasaki, Japan
  Erik Larsson, Sweden
Alex Orailoglu, USA
  Kewal K. Saluja, USA
  Hideo Tamamoto, Japan
  Dong Xiang, China
  Dafang Zhang, China

Additional Information

top

Email:

wrtlt08@aries30.cse.kyutech.ac.jp

Website:

http://aries3a.cse.kyutech.ac.jp/wrtlt08

For more information, visit us on the web at: http://aries3a.cse.kyutech.ac.jp/wrtlt08

The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT08) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and the Technical Group on Dependable Computing, IEICE .